SN74BCT8374ANT

Texas Instruments
Texas Instruments
Obsolete
Obsolete
Tube
Tube

SN74BCT8374ANT

product-img

MAIN

Manufacturer Description Packaging Series Part Status
Texas Instruments IC SCAN TEST DEVICE W/FF 24-DIP Tube 74BCT Obsolete

OTHER

  • Logic Type
    Scan Test Device with D-Type Edge-Triggered Flip-Flops
  • Supply Voltage
    4.5V ~ 5.5V
  • Number of Bits
    8
  • Operating Temperature
    0°C ~ 70°C
  • Mounting Type
    Through Hole
  • Package / Case
    24-DIP (0.300, 7.62mm)
  • Supplier Device Package
    24-PDIP