SN74BCT8374ADWR

Texas Instruments
Texas Instruments
Obsolete
Obsolete
Tape & Reel (TR)
Tape & Reel (TR)

SN74BCT8374ADWR

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Manufacturer Description Packaging Series Part Status
Texas Instruments IC SCAN TEST DEVICE W/FF 24-SOIC Tape & Reel (TR) 74BCT Obsolete

OTHER

  • Logic Type
    Scan Test Device with D-Type Edge-Triggered Flip-Flops
  • Supply Voltage
    4.5V ~ 5.5V
  • Number of Bits
    8
  • Operating Temperature
    0°C ~ 70°C
  • Mounting Type
    Surface Mount
  • Package / Case
    24-SOIC (0.295, 7.50mm Width)
  • Supplier Device Package
    24-SOIC